Sequential Path Entanglement for Quantum Metrology
نویسندگان
چکیده
منابع مشابه
Sequential Path Entanglement for Quantum Metrology
Path entanglement is a key resource for quantum metrology. Using path-entangled states, the standard quantum limit can be beaten, and the Heisenberg limit can be achieved. However, the preparation and detection of such states scales unfavourably with the number of photons. Here we introduce sequential path entanglement, in which photons are distributed across distinct time bins with arbitrary s...
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P. A. Knott,1,2,* T. J. Proctor,1 Kae Nemoto,3 J. A. Dunningham,4 and W. J. Munro2,3 1School of Physics and Astronomy, University of Leeds, Leeds LS2 9JT, United Kingdom 2NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan 3National Institute of Informatics, 2-1-2 Hitotsubashi, Chiyoda-ku, Tokyo 101-8430, Japan 4Department of Physics and A...
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2013
ISSN: 2045-2322
DOI: 10.1038/srep01779