Sequential Path Entanglement for Quantum Metrology

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چکیده

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Sequential Path Entanglement for Quantum Metrology

Path entanglement is a key resource for quantum metrology. Using path-entangled states, the standard quantum limit can be beaten, and the Heisenberg limit can be achieved. However, the preparation and detection of such states scales unfavourably with the number of photons. Here we introduce sequential path entanglement, in which photons are distributed across distinct time bins with arbitrary s...

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ژورنال

عنوان ژورنال: Scientific Reports

سال: 2013

ISSN: 2045-2322

DOI: 10.1038/srep01779